Ankersmid Ltd Eyetech Series

Beyond Particle Size

Measurement Principle

A unique time domain measurement called Laser Obscuration Time (LOT) is used by the Eyetech. A rotating laser beam scans individual particles in the sample zone. As the particles are encountered, the laser beam is obscured and interaction signals are detected by a photodiode. Since the laser beam rotates with a constant speed, the duration of the obscuration provides a direct size measurement of each particle.

Obscuration by Laser-Particle Interaction

Data is collected on single particles Direct measurement of true particle size Wide range with high resolution Independent of optical or other properties Particle size and concentration measurement Broad concentration range. Higher but also lower concentrations than laser diffraction and electrical zone sensing technologies No need for alignment or calibration

The Ultimate Particle Analyser

Eyetech Concept: Best of both worlds: Laser and Video Fast and accurate Particle Size Analysis with the unique Laser Obscuration Time Technique Accurate description of non spherical materials with sophisticated Dynamic Image Analysis The measurement relates solely and directly to the particle size Results are independent of physical or optical properties of the particle or medium

Combined Laser and Video Channel

• Unique combination of technologies based on Laser Obscuration Time and sophisticated Dynamic Shape Analysis

• Accurate analysis and characterisation of spherical, non-spherical and elongated particles

• Simultaneous results of Particle Size, concentration and Shape

• Modular design for a range of dry and wet applications

• Real-time visualisation of the sample during operation

Measurement of Single particles

To measure particle size distribution accurately, the Eyetech records on-centre and in-focus interactions only. This is achieved by filtering the shape of the Pulse Profile via sophisticated algorithms. When a particle is hit by the laser beam straight on, the slope of the Pulse Profile approaches an angle of 90 degrees, resulting in short pulse transitions. In off-centre or out-of-focus hits, the angle between the laser path and the particle boundary is significantly less then 90 degrees. Consequently, the rise and fall times of these interactions are longer and the derivative signals of the pulse transition are wider have smaller amplitude and can therefore be easily discarded. One benefit of the Laser Obscuration Time principle is that there is no assumption of particles sphericity. Furthermore, the particle size measurement is solely based on the length of the cord crossed by the laser, regardless the shape of the particle thus guaranteeing a true measurement of the particle diameter without assumptions.

---

Advantages of Dynamic Image Analysis For accurate characterization of non-spherical particles, two-dimensional shape information is essential. Differences in shape may not be reflected in the particle size distribution. Dynamic Image Analysis uses digital video microscopy to capture optimal particle images for processing. Acquired images are processed using sophisticated image analysis procedures and/or are stored for later processing.

Imaging Software Features

• Particles are visualised throughout the measurement

• No assumption of particle sphericity is required

• Reprocessing of previously stored images and videos is possible

• Grouping or filtering of particles based on size or shape

• Multiple parameters for accurate description of non-spherical materials

• Fibre analysis module

• Validation tool minimizes uncertainty related to sample preparation

Object Database Detailed Object Information for each and every measured particle including its image by a mouse click No limitation for the number of particles Easy export of the information to Excel for further processing of the data

Validate your results Microscopic precision in a dynamic system Storage of real raw data Powerful pre-processing tools for high quality image analysis Accuracy for non-spherical particles Over 40 ISO compliant shape parameters offered

Seeing is believing! User Friendly Interface Automated custom report generation Customized real-time graphs and tables Reprocessing of stored images Multiple user levels Setup wizard for easy start-up 21 CFR Part 11 compliant

Eyetech Measurement Cells & Accessories

A range of accessories is available to adapt the Eyetech to any application. The materials are analysed closest to their original state, rather than adapting the nature of the sample to the instrument.

Sample Presentation:

WET

DRY

SURFACE

AIRBORNE

Please call PsS today for advice on your particular application

Email PsS for a full colour pdf brochure

Visit the Ankersmid Website

for additional products available

www.ankersmid.co.il