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Analytical Methods in Fine Particle Technology

Written by Paul A. Webb and Clyde Orr,

with contributions from:

Ronnie W. Camp, James P. Olivier and Y. Simon Yunes.

©1997 by Micromeritics Instrument Corporation;

ISBN 0-9656783-0-X.


Materials analysis is critical in the development of advanced products. It guides investment in the development of improved production processes, new applications and tighter standards. In fact, analytical results play a critically influential role in many of today's major business decisions. With that in mind Micromeritics has published a new book, "Analytical Methods in Fine Particle Technology," which focuses on techniques for obtaining reliable quantitative and statistical data using particle measurement technologies.

amifpt_cover_l Chapters are organized into the following six topic areas:

  1. Particle size by sedimentation
  2. Surface area and pore structure by gas adsorption
  3. Pore structure by mercury intrusion porosimetry
  4. Density
  5. Chemical adsorption
  6. Zeta potential as well as contact angle

For anyone involved in assessing or controlling one or more of these material properties, the book offers laboratory best practices, guidelines for interpreting results, and insight into the theoretical and computational foundations of the analysis.

The knowledge and expertise of Micromeritics' chief scientific and engineering staff have been captured and preserved in the book. Whether you are looking for solutions or new ideas, this book will be a major resource in your laboratory.

Request:

Analytical Methods in Fine Particle Technology

AU$150 plus shipping.

 

                                                                                                                                                                                                                                                                                                                                                                                                                           

Last Updated on Friday, 22 October 2010 11:23